|author||Eric Anholt||2012-01-03 16:32:18 -0600|
|committer||Eric Anholt||2012-01-04 16:49:44 -0600|
intel: Add regression tests for batch decode.
The .batch was generated using the dump-a-batch branch of git://people.freedesktop.org/~anholt/mesa using glxgears on gen7 hardware, using INTEL_DEVID_OVERRIDE for non-gen7 (this means that offsets in the buffers for non-gen7 are 0!). The .ref was generated by: ./test_decode tests/gen7-3d.batch -dump. The .sh exists because you can't supply arguments to tests using the simple automake tests driver. Something reasonable could be done using automake's parallel-tests driver (in fact, a previous version of the patch did that), but I was concerned that: 1) The parallel-tests driver is documented to be unstable -- they may change interfaces on us later. 2) The parallel-tests driver hides the output of tests in .log files scattered all over the tree, which was ugly and more painful to work with. v2: Actually add the batch files, add a .gitignore for the *-new.txt files added after failures, and fix failure mode for undetected chipset name. Reviewed-by: Daniel Vetter <email@example.com> (v1)
Diffstat (limited to 'include/drm/i915_drm.h')
0 files changed, 0 insertions, 0 deletions